- 使用性能出众的微波网络分析仪，应对苛刻的测量挑战
- 在测量 S 参数时实现超低的不确定度和超高稳定度
- 利用应用软件简化设置，高效表征有源器件
- 通过定制化配置得到恰当的性能，满足您的特殊预算和测量需求
- 多点触控屏和直观的用户界面加速对元器件特性的分析
选件
| N5224B-200 | 2-port, base hardware configuration |
| N5224B-201 | 2-port with configurable test set, reference mixer switch |
| N5224B-205 | 2-port with configurable test set, ref mixer switch, bias tees, low frequency extension |
| N5224B-210 | 2-port with metrology configuration |
| N5224B-217 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-219 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-220 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
| N5224B-400 | 4-port with second source |
| N5224B-401 | 4-port with second source, configurable test set, reference mixer switch |
| N5224B-405 | 4-port with second source, configurable test set, reference mixer switch, bias tees, low frequency extension |
| N5224B-410 | 4-port with second source, metrology configuration |
| N5224B-417 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-419 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-420 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
